Veeco's Dimension Icon Atomic Force Microscope (AFM) brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Incorporating the latest evolution of Veeco’s industry-leading tip-scanning AFM technology, the Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the noise performance of most open-loop, high-resolution AFMs. Also watch this episode:
Dimension Icon AFM Walkthrough. For more information, go to:
Veeco.
Hosted by: Lou Frenzel Videography by: Curtis Ellzey Edited by: Curtis Ellzey
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