Veeco's John Thornton takes us through the operation of their Dimension Icon Atomic Force Microscope to scan the surface of a gallium nitride wafer. Many of the Dimension Icon AFM’s new features are engineered specifically to enhance technical performance while simultaneously increasing usability and productivity for both new and expert AFM users. The system utilizes a revolutionary XYZ closed-loop head that scans at high-speed rates while delivering extremely low drift and low noise. These features combine to drastically cut stabilization times, allowing the system to acquire artifact-free data in much less time than is possible with any competing AFM on the market. Also watch this episode:
Dimension Icon Atomic Force Microscope. For more information, go to:
Veeco.
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